I. Abt, A. Caldwell, J. Liu, B. Majorovits, P. Petrov, O. Volynets
A fast method to determine the crystallographic axes of segmented true-coaxial high-purity germanium detectors is presented. It is based on the analysis of segment-occupancy patterns obtained by irradiation with radioactive sources. The measured patterns are compared to predictions for different axes orientations. The predictions require a simulation of the trajectories of the charge carriers taking the transverse anisotropy of their drift into account.
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http://arxiv.org/abs/1112.5291
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